Product Line

Surface particles
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QIII LS Surface Particle Detection (SPD)

QIII LS

Surface Particle Detection (SPD)

Description
"Pentagon Technologies™ line of surface particle detectors is the standard in high technology markets for measuring and controlling surface contamination. Particles that accumulate on your critical surfaces or product can reduce yield and reliability. Particles below 100um in diameter are very difficult to see with the naked eye. These particles settle fast and escape routine air monitoring. The QIII LS Surface Particle Detector measures particles in the sub-visible to visible range (5 -300um).

Use the QIII LS to eliminate the particles that cost you time and money.

Benefits

Instant measurements of surface particulate
Improve yield by reducing particles in your product
Minimize troubleshooting time by quickly identifying particle sources
Monitor and set limits for particle density on incoming or outgoing materials
Drive continuous improvement through particle baseline studies
Test to ISO 14644-9 classification of surface cleanliness
Capture counted particles for analysis with optional Particle Analysis Module"
Specification
"Particle sensitivity range: 5um -300um
Channels: 5,25,50,75,100,>125um (customizable)
Sensor: Laser Diode
Size & Weight: 14"" W X 13.5"" D X 9"" H, 19 lbs
Batteries: (2) Lithium Ion, hot swappable
Display: 7"" WVGA with touch screen interface
Data Units: Particle Density and Raw counts
Data Output: USB port or ethernet
Probe Included: 1/2"" right angle probe with 4 ft (122 cm) of tubing.
Purge Options Included: Purge Filter to zero count the detector and a Purge Probe Function to zero count the probe.
Input power: 100-240 VAC, 50/60 hz
Sampling Modes: Static and Dynamic"
History
    3Inquiry